On-Wafer Near Field OTA Measurement
A Practical Measurement Solution for On-Chip Antenna, up to V band
The measurement solution can be implemented in the proto-type stage for each antenna before scaling up to thousand phase array antenna, and also can be used in the production line to enhance the production quality. It becomes a complimentary solution with conventional far-field measurement chamber.
Measured Radiation Pattern
Normalized radiation pattern of the standard horn antenna at (a) H-plane and (b) E-plane.
Measurement System
Phasetrum provides a total test solution without a chamber to verify on-chip antenna radiation pattern.
Measured Radiation Pattern
Measured upper hemisphere radiation pattern of the standard horn antenna by Phasetrum on-wafer OTA measurement solution.
On Wafer Measurement
By sweeping the 2D area, it help to verify on-chip antenna radiation pattern as fast and precise as using a far-field chamber solution, without the unwanted scattering and the absorber/reflector interference.
Transformation of Near Field to Far Field Radiation Pattern
The far-field radiation patterns can be expressed as an integral
formula of the near-field results.